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The effects of common errors on sealing ability of total-etch adhesives
Masanori Hashimoto, Franklin R. Tay, Nadia R. Svizero, Anton J. de Gee, Albert J. Feilzer, Hidehiko Sano, Masayuki Kaga, David H. PashleyVolume:
22
Year:
2006
Language:
english
Pages:
9
DOI:
10.1016/j.dental.2005.06.004
File:
PDF, 429 KB
english, 2006