Application of a strip-yield model to predict crack growth under variable-amplitude and spectrum loading – Part 1: Compact specimens
Y. Yamada, B. Ziegler, J.C. Newman Jr.Volume:
78
Year:
2011
Language:
english
Pages:
12
DOI:
10.1016/j.engfracmech.2011.06.015
File:
PDF, 902 KB
english, 2011