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Application of a strip-yield model to predict crack growth under variable-amplitude and spectrum loading – Part 2: Middle-crack-tension specimens
B. Ziegler, Y. Yamada, J.C. Newman Jr.Volume:
78
Year:
2011
Language:
english
Pages:
11
DOI:
10.1016/j.engfracmech.2011.06.018
File:
PDF, 1024 KB
english, 2011