Estimation of a data-collection maturity model to detect manufacturing change
Chun-Wu Yeh, Der-Chiang Li, Yao-Ren ZhangVolume:
39
Year:
2012
Language:
english
Pages:
9
DOI:
10.1016/j.eswa.2012.01.036
File:
PDF, 712 KB
english, 2012