Quantitative XPS depth profiling of codeine loaded...

Journal of Controlled Release 2009 Vol. 138; Iss. 1

Quantitative XPS depth profiling of codeine loaded poly(l-lactic acid) films using a coronene ion sputter source

Ali Rafati, Martyn C. Davies, Alexander G. Shard, Simon Hutton, Gautam Mishra, Morgan R. Alexander
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Volume:
138
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.jconrel.2009.05.005
File:
PDF, 542 KB
english, 2009
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