Copper spacer thickness dependence of the exchange bias in...

Journal of Magnetism and Magnetic Materials 2007 Vol. 316; Iss. 2

Copper spacer thickness dependence of the exchange bias in IrMn/Cu/Co ultrathin films

S. Nicolodi, L.C.C.M. Nagamine, A.D.C. Viegas, J.E. Schmidt, L.G. Pereira, C. Deranlot, F. Petroff, J. Geshev
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Volume:
316
Year:
2007
Language:
english
Pages:
1
DOI:
10.1016/j.jmmm.2007.02.048
File:
PDF, 251 KB
english, 2007
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