In-plane strain measurements on a microscopic scale by coupling digital image correlation and an in situ SEM technique
Fabienne Lagattu, Florent Bridier, Patrick Villechaise, Jean BrillaudVolume:
56
Year:
2006
Language:
english
Pages:
9
DOI:
10.1016/j.matchar.2005.08.004
File:
PDF, 454 KB
english, 2006