SEM, Scanning Auger and XPS characterization of chemically...

SEM, Scanning Auger and XPS characterization of chemically pretreated Ti surfaces intended for biomedical applications

M. Pisarek, M. Lewandowska, A. Roguska, K.J. Kurzydłowski, M. Janik-Czachor
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Volume:
104
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.matchemphys.2007.02.088
File:
PDF, 373 KB
english, 2007
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