Refractive index depth profile and its relaxation in...

Refractive index depth profile and its relaxation in polydimethylsiloxane (PDMS) due to proton irradiation

S.Z. Szilasi, J. Budai, Z. Pápa, R. Huszank, Z. Tóth, I. Rajta
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Volume:
131
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.matchemphys.2011.09.058
File:
PDF, 322 KB
english, 2011
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