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Effects of Ni film thickness on the structural stability of Si/Ni/Cu film electrodes
Gyu Bong Cho, Kwon Koo Cho, Ki Won KimVolume:
60
Year:
2006
Language:
english
Pages:
4
DOI:
10.1016/j.matlet.2005.07.078
File:
PDF, 387 KB
english, 2006