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Structure evolution and ferroelectric properties of Bi3.4Yb0.6Ti3O12 thin films crystallized under a moderate temperature
C.P. Cheng, M.H. Tang, Z. Ye, X.L. Zhong, X.J. Zheng, Y.C. Zhou, Z.S. HuVolume:
61
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.matlet.2006.11.116
File:
PDF, 624 KB
english, 2007