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In-situ synchrotron x-ray study of the crystallization behavior of Ce0.9La0.1O2 − x thin films deposited on NiW alloy substrates by chemical solution method
Y. Zhao, J.C. Grivel, A.B. Abrahamsen, P.G.A.P. Pallewatta, D. He, J. Bednarčík, M.v ZimmermannVolume:
65
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.matlet.2011.05.072
File:
PDF, 532 KB
english, 2011