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Stacking faults at the boundary between 15R- and 4H-polytype in SiC
Shenghuang Lin, Zhiming Chen, Yintu Ba, Mingchao Yang, Lianbi LiVolume:
81
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.matlet.2012.05.004
File:
PDF, 592 KB
english, 2012