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Reliability of III–V devices – The defects that cause the trouble
Sokrates T. Pantelides, Yevgeniy Puzyrev, Xiao Shen, Tania Roy, Sandeepan DasGupta, Blair R. Tuttle, Daniel M. Fleetwood, Ronald D. SchrimpfVolume:
90
Year:
2012
Language:
english
Pages:
6
DOI:
10.1016/j.mee.2011.04.019
File:
PDF, 1.24 MB
english, 2012