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Impact of increased resistive losses of metal interconnects upon ULSI devices reliability and functionality
Alexander Rysin, Pavel Livshits, Sergey Sofer, Yefim FeferVolume:
92
Year:
2012
Language:
english
Pages:
4
DOI:
10.1016/j.mee.2011.04.045
File:
PDF, 418 KB
english, 2012