Resistive switching characteristics of thin NiO film based flexible nonvolatile memory devices
Hongjun Wang, Changwei Zou, Lin Zhou, Canxin Tian, Dejun FuVolume:
91
Year:
2012
Language:
english
Pages:
3
DOI:
10.1016/j.mee.2011.05.037
File:
PDF, 359 KB
english, 2012