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Detection of traps induced and activated by high field stress in an N-channel VDMOSFET transistor using current deep level transient spectroscopy (CDLTS)
N. Abboud, Y. Cuminal, A. Foucaran, C. SalameVolume:
88
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2011.08.008
File:
PDF, 673 KB
english, 2011