Local thickness measurement through scattering contrast and electron energy-loss spectroscopy
Huai-Ruo Zhang, Ray F. Egerton, Marek MalacVolume:
43
Year:
2012
Language:
english
Pages:
8
DOI:
10.1016/j.micron.2011.07.003
File:
PDF, 1.77 MB
english, 2012