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Tunneling component suppression in charge pumping measurement and reliability study for high-k gated MOSFETs
Chun-Chang Lu, Kuei-Shu Chang-Liao, Chun-Yuan Lu, Shih-Cheng Chang, Tien-Ko Wang, Fu-Chung Hou, Yao-Tung HsuVolume:
51
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2011.04.021
File:
PDF, 1.03 MB
english, 2011