Tunneling component suppression in charge pumping...

Microelectronics Reliability 2011 Vol. 51; Iss. 12

Tunneling component suppression in charge pumping measurement and reliability study for high-k gated MOSFETs

Chun-Chang Lu, Kuei-Shu Chang-Liao, Chun-Yuan Lu, Shih-Cheng Chang, Tien-Ko Wang, Fu-Chung Hou, Yao-Tung Hsu
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
51
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2011.04.021
File:
PDF, 1.03 MB
english, 2011
Conversion to is in progress
Conversion to is failed