On the profile of frequency and voltage dependent interface states and series resistance in (Ni/Au)/Al0.22Ga0.78N/AlN/GaN heterostructures by using current–voltage (I–V) and admittance spectroscopy methods
S. Demirezen, Ş. Altındal, S. Özçelik, E. ÖzbayVolume:
51
Year:
2011
Language:
english
Pages:
10
DOI:
10.1016/j.microrel.2011.05.010
File:
PDF, 957 KB
english, 2011