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Concurrent PBTI and hot carrier degradation in n-channel MuGFETs
Sueng Min Lee, Dong Hun Lee, Jae Ki Lee, Jong Tae ParkVolume:
51
Year:
2011
Language:
english
Pages:
3
DOI:
10.1016/j.microrel.2011.06.006
File:
PDF, 628 KB
english, 2011