![](/img/cover-not-exists.png)
Tiny-scale “stealth” current sensor to probe power semiconductor device failure
Yuya Kasho, Hidetoshi Hirai, Masanori Tsukuda, Ichiro OmuraVolume:
51
Year:
2011
Language:
english
Pages:
1
DOI:
10.1016/j.microrel.2011.06.015
File:
PDF, 1.81 MB
english, 2011