![](/img/cover-not-exists.png)
Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technology
R. Liu, D. Schreurs, W. De Raedt, F. Vanaverbeke, J. Das, R. Mertens, I. De WolfVolume:
51
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2011.06.034
File:
PDF, 681 KB
english, 2011