Applying Bayesian mixtures-of-experts models to statistical...

Microelectronics Reliability 2011 Vol. 51; Iss. 9-11

Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability

Olivia Bluder, Michael Glavanovics, Jürgen Pilz
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Volume:
51
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2011.06.038
File:
PDF, 803 KB
english, 2011
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