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S-parameter performance degradation in power RF N-LDMOS devices due to hot carrier effects
M.A. Belaïd, M. Gares, K. Daoud, Ph. EudelineVolume:
51
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2011.06.040
File:
PDF, 690 KB
english, 2011