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Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis
G. Bascoul, P. Perdu, A. Benigni, S. Dudit, G. Celi, D. LewisVolume:
51
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2011.06.043
File:
PDF, 1.12 MB
english, 2011