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ANSYS based 3D electro-thermal simulations for the evaluation of power MOSFETs robustness
Stefano de Filippis, Vladimír Košel, Donald Dibra, Stefan Decker, Helmut Köck, Andrea IraceVolume:
51
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2011.06.047
File:
PDF, 878 KB
english, 2011