Photoelectric Laser Stimulation applied to Latch-Up...

Microelectronics Reliability 2011 Vol. 51; Iss. 9-11

Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory

R. Llido, J. Gomez, V. Goubier, N. Froidevaux, L. Dufayard, G. Haller, V. Pouget, D. Lewis
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Volume:
51
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2011.06.050
File:
PDF, 690 KB
english, 2011
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