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Laser induced impact ionization effect in MOSFET during 1064 nm laser stimulation
Sanjib Kumar Brahma, Arkadiusz Glowacki, Reiner Leihkauf, Christian BoitVolume:
51
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2011.06.055
File:
PDF, 1.33 MB
english, 2011