Failure analysis defect location on a real case...

Microelectronics Reliability 2011 Vol. 51; Iss. 9-11

Failure analysis defect location on a real case 55 nm memory using dynamic power supply emulation

Thierry Parrassin, Guillaume Celi, Sylvain Dudit, Michel Vallet
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Volume:
51
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2011.06.056
File:
PDF, 1.50 MB
english, 2011
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