Application of transient interferometric mapping method for ESD and latch-up analysis
D. Pogany, S. Bychikhin, M. Heer, W. Mamanee, E. GornikVolume:
51
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2011.07.016
File:
PDF, 181 KB
english, 2011