Reliability issues of GaN based high voltage power devices
J. Wuerfl, E. Bahat-Treidel, F. Brunner, E. Cho, O. Hilt, P. Ivo, A. Knauer, P. Kurpas, R. Lossy, M. Schulz, S. Singwald, M. Weyers, R. ZhytnytskaVolume:
51
Year:
2011
Language:
english
Pages:
7
DOI:
10.1016/j.microrel.2011.07.017
File:
PDF, 1.10 MB
english, 2011