Control of the electromagnetic compatibility: An issue for...

Microelectronics Reliability 2011 Vol. 51; Iss. 9-11

Control of the electromagnetic compatibility: An issue for IC reliability

Jean-Baptiste Gros, Genevieve Duchamp, Jean-Luc Levant, Christian Marot
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Volume:
51
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2011.07.053
File:
PDF, 867 KB
english, 2011
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