Reliability study of AlGaN/GaN HEMT under electromagnetic,...

Microelectronics Reliability 2011 Vol. 51; Iss. 9-11

Reliability study of AlGaN/GaN HEMT under electromagnetic, RF and DC stress

S. Khemiri, M. Kadi, A. Louis
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
51
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2011.07.074
File:
PDF, 899 KB
english, 2011
Conversion to is in progress
Conversion to is failed