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A full characterization of single pitch IO ESD protection based on silicon controlled rectifier and dynamic trigger circuit in CMOS 32 nm node
J. Bourgeat, P. Galy, A. Dray, J. Jimenez, D. Marin-Cudraz, B. JacquierVolume:
51
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2011.07.078
File:
PDF, 833 KB
english, 2011