The role of surface barrier oxidation on AlGaN/GaN HEMTs...

Microelectronics Reliability 2012 Vol. 52; Iss. 1

The role of surface barrier oxidation on AlGaN/GaN HEMTs reliability

Milan Ťapajna, Nicole Killat, Uttiya Chowdhury, Jose L. Jimenez, Martin Kuball
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Volume:
52
Year:
2012
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2011.09.009
File:
PDF, 350 KB
english, 2012
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