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Depth-resolved residual stress analysis of thin coatings by a new FIB–DIC method
Marco Sebastiani, Christoph Eberl, Edoardo Bemporad, George M. PharrVolume:
528
Year:
2011
Language:
english
Pages:
8
DOI:
10.1016/j.msea.2011.07.001
File:
PDF, 1014 KB
english, 2011