Characterization of etch pit formation via the...

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2011 Vol. 652; Iss. 1

Characterization of etch pit formation via the Everson-etching method on CdZnTe crystal surfaces from the bulk to the nanoscale

Lucile C. Teague, Martine C. Duff, James R. Cadieux, Raji Soundararajan, Charles R. Shick Jr., Kelvin G. Lynn
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Volume:
652
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.nima.2010.09.061
File:
PDF, 1.17 MB
english, 2011
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