Update of the annealing scenario for irradiated silicon...

Update of the annealing scenario for irradiated silicon p-in-n microstrip sensors

P.J. Dervan, C. Wigglesworth, J. Vossebeld, G. Casse, A. Affolder, A. Greenall
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Volume:
658
Year:
2011
Language:
english
Pages:
3
DOI:
10.1016/j.nima.2011.04.046
File:
PDF, 205 KB
english, 2011
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