Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
2011 Vol. 660; Iss. 1
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Analysis of strain error sources in micro-beam Laue diffraction
Felix Hofmann, Sophie Eve, Jonathan Belnoue, Jean-Sébastien Micha, Alexander M. KorsunskyVolume:
660
Year:
2011
Language:
english
Pages:
8
DOI:
10.1016/j.nima.2011.09.009
File:
PDF, 650 KB
english, 2011