Heavy-ion ERDA and spectroscopic ellipsometry...

Heavy-ion ERDA and spectroscopic ellipsometry characterization of a SiOC:H layered structure as functional coating on polymeric lenses

U. Kreissig, R. Gago, M. Vinnichenko, P. Fernández-Hidalgo, R.J. Martı́n-Palma, J.M. Martı́nez-Duart
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Volume:
219-220
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.nimb.2004.01.186
File:
PDF, 352 KB
english, 2004
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