Structural analysis of amorphous-nanocrystalline silicon...

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2012 Vol. 284; Iss. none

Structural analysis of amorphous-nanocrystalline silicon thin films by grazing incidence X-ray diffraction

Krunoslav Juraić, Davor Gracin, Igor Djerdj, Andrea Lausi, Miran Čeh, Davor Balzar
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Volume:
284
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.nimb.2011.07.018
File:
PDF, 958 KB
english, 2012
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