X-ray analyses of thermally grown and reactively sputtered...

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2012 Vol. 284; Iss. none

X-ray analyses of thermally grown and reactively sputtered tantalum oxide films on NiTi alloy

Karrina McNamara, Syed A.M. Tofail, Derek Conroy, James Butler, Abbasi A. Gandhi, Wynette Redington
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Volume:
284
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.nimb.2011.07.106
File:
PDF, 739 KB
english, 2012
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