Diffraction Anomalous Fine Structure study and atomistic...

Diffraction Anomalous Fine Structure study and atomistic simulation of Ge/Si nanoislands

N.A. Katcho, M.-I. Richard, M.G. Proietti, H. Renevier, C. Leclere, V. Favre-Nicolin, J.J. Zhang, G. Bauer
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Volume:
284
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.nimb.2011.08.003
File:
PDF, 679 KB
english, 2012
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