Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
2012 Vol. 283; Iss. none
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Analysis of charged particle induced reactions for beam monitor applications
K. Surendra Babu, Young-Ouk Lee, S. MukherjeeVolume:
283
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.nimb.2012.04.009
File:
PDF, 860 KB
english, 2012