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X-ray microanalysis of organic thin sections in TEM using an UTW Si(Li) detector: Comparison of quantification methods
Patrice Laquerriere, Vincent Banchet, Jean Michel, Karl Zierold, Gérard Balossier, Pierre BonhommeVolume:
52
Year:
2001
Language:
english
Pages:
8
DOI:
10.1002/1097-0029(20010115)52:23.0.co;2-f
File:
PDF, 143 KB
english, 2001