Depth-encoded spectral domain phase microscopy for...

Optics Communications 2011 Vol. 284; Iss. 19

Depth-encoded spectral domain phase microscopy for simultaneous multi-site nanoscale optical measurements

Hansford C. Hendargo, Bradley A. Bower, Alex S. Reinstein, Neal Shepherd, Yuankai K. Tao, Joseph A. Izatt
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Volume:
284
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.optcom.2011.06.001
File:
PDF, 752 KB
english, 2011
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