An experimental investigation of P–N diode electrical...

Optics & Laser Technology 2012 Vol. 44; Iss. 3

An experimental investigation of P–N diode electrical characteristics by soft X-ray annealing method

Itsara Srithanachai, Surada Ueamanapong, Amporn Poyai, Surasak Niemcharoen, Preecha P. Yupapin
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Volume:
44
Year:
2012
Language:
english
Pages:
5
DOI:
10.1016/j.optlastec.2011.09.012
File:
PDF, 736 KB
english, 2012
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