Antireflective characteristics of Ge1−xCx films on...

Antireflective characteristics of Ge1−xCx films on sub-wavelength structured ZnS surfaces

Qiyuan Xu, Zhengtang Liu, Yangping Li, Xingsen Che, Qian Wu
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Volume:
34
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.optmat.2011.08.017
File:
PDF, 593 KB
english, 2011
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