Study on structural properties of epitaxial silicon films...

Physica B: Condensed Matter 2012 Vol. 407; Iss. 12

Study on structural properties of epitaxial silicon films on annealed double layer porous silicon

Zhihao Yue, Honglie Shen, Hong Cai, Hongjie Lv, Bin Liu
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Volume:
407
Year:
2012
Language:
english
Pages:
4
DOI:
10.1016/j.physb.2012.03.014
File:
PDF, 456 KB
english, 2012
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